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SiC 結晶中の積層欠陥の透過電子顕微鏡による構造解析
https://cit.repo.nii.ac.jp/records/122
https://cit.repo.nii.ac.jp/records/122e238979f-799b-493d-87b7-4916f262414e
名前 / ファイル | ライセンス | アクション |
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SiC 結晶中の積層欠陥の透過電子顕微鏡による構造解析 (2.1 MB)
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Item type | 紀要論文_JAIRO Cloud(WEKO3)対応_56aaa311(1) | |||||
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公開日 | 2016-01-01 | |||||
タイトル | ||||||
タイトル | SiC 結晶中の積層欠陥の透過電子顕微鏡による構造解析 | |||||
タイトル | ||||||
タイトル | Evaluation of Stacking Faults in SiC Crystal by Transmission Election Microscope | |||||
言語 | ||||||
言語 | jpn | |||||
キーワード | ||||||
主題 | ワイドギャップ半導体パワーデバイス | |||||
キーワード | ||||||
主題 | SiC | |||||
キーワード | ||||||
主題 | 積層欠陥 | |||||
キーワード | ||||||
主題 | X 線トポグラフィ | |||||
キーワード | ||||||
主題 | 透過電子顕微鏡(TEM) | |||||
キーワード | ||||||
主題 | wide bandgap semiconductors | |||||
キーワード | ||||||
主題 | SiC | |||||
キーワード | ||||||
主題 | stacking Fauls | |||||
キーワード | ||||||
主題 | X-ray topography | |||||
キーワード | ||||||
主題 | transmission electron microscope(TEM) | |||||
資源タイプ | ||||||
資源タイプ識別子 | http://purl.org/coar/resource_type/c_6501 | |||||
資源タイプ | departmental bulletin paper | |||||
著者 |
山本, 秀和
× 山本, 秀和× 白鳥, 美帆 |
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書誌情報 |
千葉工業大学研究報告 en : Report of Chiba Institute of Technology 巻 63, p. 23-28, 発行日 2016-01-01 |
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出版者 | ||||||
出版者 | Chiba Institute of Technology | |||||
著者版フラグ | ||||||
出版タイプ | AM | |||||
出版タイプResource | http://purl.org/coar/version/c_ab4af688f83e57aa |